Quantitative Dynamic Atomic Force Microscopy

Authored by: Robert W. Stark , Martin Stark

1 Handbook of Nanophysics

Print publication date:  September  2010
Online publication date:  September  2010

Print ISBN: 9781420075403
eBook ISBN: 9781420075410
Adobe ISBN:


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Unquestioned, the atomic force microscope (AFM) (Binnig et al. 1986) is capable of surface imaging at very high resolution. However, at its very base, the AFM is an instrument to measure—and to exert—small forces. Typical forces range from one piconewton to several micronewtons. Various measurement modes are used to address specific questions in analytic materials science, physics, chemistry, and life sciences.

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