Quantitative Dynamic Atomic Force Microscopy

Authored by: Robert W. Stark , Martin Stark

1 Handbook of Nanophysics

Print publication date:  September  2010
Online publication date:  September  2010

Print ISBN: 9781420075403
eBook ISBN: 9781420075410
Adobe ISBN:

10.1201/9781420075410-40

 Download Chapter

 

Abstract

Unquestioned, the atomic force microscope (AFM) (Binnig et al. 1986) is capable of surface imaging at very high resolution. However, at its very base, the AFM is an instrument to measure—and to exert—small forces. Typical forces range from one piconewton to several micronewtons. Various measurement modes are used to address specific questions in analytic materials science, physics, chemistry, and life sciences.

 Cite
Search for more...
Back to top

Use of cookies on this website

We are using cookies to provide statistics that help us give you the best experience of our site. You can find out more in our Privacy Policy. By continuing to use the site you are agreeing to our use of cookies.