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Semiconductor Devices in Harsh Conditions

Edited by: Kirsten Weide-Zaage , Malgorzata Chrzanowska-Jeske , Krzysztof Iniewski

Print publication date:  November  2016
Online publication date:  November  2016

Print ISBN: 9781498743808
eBook ISBN: 9781315368948
Adobe ISBN:

10.1201/9781315368948
 Cite  Marc Record

Book description

This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity.

With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.

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